Complete system, consisting of:
     * Optical Emission Spectograph, OBLF QS N750
     * Wave Length-Dispersive X-Ray Flores, Panalytical Axios Fast
     * Robot Arm Feeder table, ABB IRB 1600 - 6/1 .45
     * Machining Centre, Fanuc T21iF
The robot positions the sample in the saw/milling machine and then in the analysis equipment. The system use of simultaneous Wavelength-Dispersive X-Ray Fluorescence for the main elements, and an Optical Emission Spectrograph for the light trace elements. Software produces a combined measurement result based on detection limits and calibration ranges of both analysis appliances.

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