Complete system, consisting of:
* Optical Emission Spectograph, OBLF QS N750
* Wave Length-Dispersive X-Ray Flores, Panalytical Axios Fast
* Robot Arm Feeder table, ABB IRB 1600 - 6/1 .45
* Machining Centre, Fanuc T21iF
The robot positions the sample in the saw/milling machine and then in the analysis equipment. The system use of simultaneous Wavelength-Dispersive X-Ray Fluorescence for the main elements, and an Optical Emission Spectrograph for the light trace elements. Software produces a combined measurement result based on detection limits and calibration ranges of both analysis appliances.
Pananalytical X-ray and optical emission analysis
